| Title | Extending Trace History Through Tapered Summaries in Post-silicon Validation |
| Author | *Sandeep Chandran, Preeti Ranjan Panda, Smruti R. Sarangi (Indian Inst. of Tech. Delhi, India), Deepak Chauhan, Sharad Kumar (Freescale Semiconductors India Pvt, India) |
| Page | pp. 737 - 742 |
| Detailed information (abstract, keywords, etc) | |
| Title | Novel Applications of Deep Learning Hidden Features for Adaptive Testing |
| Author | *Bingjun Xiao (Univ. of California, Los Angeles, U.S.A.), Jinjun Xiong (IBM Research, U.S.A.), Yiyu Shi (Univ. of Notre Dame, U.S.A.) |
| Page | pp. 743 - 748 |
| Detailed information (abstract, keywords, etc) | |
| Title | Mixed 01X-RSL-Encoding for Fast and Accurate ATPG with Unknowns |
| Author | *Dominik Erb, Karsten Scheibler (Univ. of Freiburg, Germany), Michael A. Kochte (Univ. of Stuttgart, Germany), Matthias Sauer (Univ. of Freiburg, Germany), Hans-Joachim Wunderlich (Univ. of Stuttgart, Germany), Bernd Becker (Univ. of Freiburg, Germany) |
| Page | pp. 749 - 754 |
| Detailed information (abstract, keywords, etc) | |
| Title | Test and Diagnosis Pattern Generation for Dynamic Bridging Faults and Transition Delay Faults |
| Author | *Cheng-Hung Wu, Saint James Lee, Kuen-Jong Lee (National Cheng Kung Univ., Taiwan) |
| Page | pp. 755 - 760 |
| Detailed information (abstract, keywords, etc) | |