Title | (Invited Paper) Efficient Reliability Management in SoCs – An Approximate DRAM Perspective |
Author | Matthias Jung, Deepak M. Mathew, Christian Weis, *Norbert Wehn (Univ. of Kaiserslautern, Germany) |
Page | pp. 390 - 394 |
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Title | (Invited Paper) Cross-layer Virtual/Physical Sensing and Actuation for Resilient Heterogeneous Many-core SoCs |
Author | *Santanu Sarma, Tiago Mück, Majid Shoushtari, Abbas BanaiyanMofrad, Nikil Dutt (UC Irvine, U.S.A.) |
Page | pp. 395 - 402 |
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Title | (Invited Paper) On-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations |
Author | A.K.M. Mahfuzul Islam (Univ. of Tokyo, Japan), *Hidetoshi Onodera (Kyoto Univ., Japan) |
Page | pp. 403 - 409 |
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Title | (Invited Paper) Embedded Software Reliability Testing by Unit-Level Fault Injection |
Author | Petra R. Maier, Daniel Mueller-Gritschneder, Ulf Schlichtmann (TU Munich, Germany), *Veit B. Kleeberger (Infineon Technologies, Germany) |
Page | pp. 410 - 416 |
Detailed information (abstract, keywords, etc) |