Title | (Invited Paper) In-Situ Studies of High-k/High Mobility Interfaces |
Author | *Robert Wallace (Univ. of Texas, Dallas, U.S.A.) |
Page | pp. 137 - 138 |
Title | Effective Hole Mobility of GOI MOSFET Fabricated by Lateral Liquid-Phase Epitaxiay |
Author | *Takuji Hosoi, Yuichiro Suzuki, Hiroaki Nishikawa, Masahiro Matsue, Takayoshi Shimura, Heiji Watanabe (Osaka Univ., Japan) |
Page | pp. 139 - 140 |
Title | Effect of Electric Field in Multi-Electron Wave Packet Dynamics in Channel of Nanoscale MOSFETs |
Author | *Genki Fujita, Taro Shiokawa (Univ. of Tsukuba, Japan), Yukihiro Takada (Tokyo Univ. of Science, Japan), Satoru Konabe (Univ. of Tsukuba/CREST, JST, Japan), Masakazu Muraguchi (Tohoku Univ./CREST, JST, Japan), Takahiro Yamamoto (Tokyo Univ. of Science, Japan), Tetsuo Endoh (Tohoku Univ./CREST, JST, Japan), Yasuhiro Hatsugai (Univ. of Tsukuba/Tohoku Univ., Japan), Kenji Shiraishi (Univ. of Tsukuba/Nagoya Univ., Japan) |
Page | pp. 141 - 142 |
Title | Impact of HfO2 Buffer Layers on SrHfO3 Perovskite Metal-Oxide-Semiconductor Capacitors on Si Substrates |
Author | *Shinji Migita, Yukinori Morita, Meishoku Masahara, Hiroyuki Ota (AIST, GNC, Japan) |
Page | pp. 143 - 144 |