(Back to Session Schedule)

2013 International Workshop on
DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES: SCIENCE AND TECHNOLOGY

Session S7  Memory & Variability
Time: 13:30 - 15:00 Saturday, November 9, 2013
Chair: Masao Inoue (Renesas Electronics, Japan)

S7-1 (Time: 13:30 - 14:00)
Title(Invited Paper) Non-Volatile Data Storage in HfO2-Based Ferroelectric FETs
Author*Uwe Schroeder, E. Yurchuk (NaMLab GmbH, Germany), J. Mueller (Fraunhofer IPMS-CNT, Germany), S. Slesazeck, D. Martin (NaMLab GmbH, Germany), T. Schloesser, R. Boschke, R. v. Bentum (GLOBALFOUNDRIES, Germany), T. Mikolajick (TU Dresden, Germany)
Pagep. 129

S7-2 (Time: 14:00 - 14:20)
TitleBidirectional Unipolar Switching of Al/AlOx/ITO Flexible ReRAM
Author*Fang Yuan (Tsinghua Univ., China), Jer-Chyi Wang (Chang Gung Univ., Taiwan), Zhigang Zhang (Tsinghua Univ., China), Yu-Ren Ye (Chang Gung Univ., Taiwan), Liyang Pan, Jun Xu (Tsinghua Univ., China), Chao-Sung Lai (Chang Gung Univ., Taiwan)
Pagepp. 131 - 132

S7-3 (Time: 14:20 - 14:40)
TitleAn Atomistic Study on H and N Incorporation Effects for Oxygen Vacancies in SiO2 Layer of MONOS Type Memories by First Principles Calculations
Author*Hiroki Shirakawa, Keita Yamaguchi (Univ. of Tsukuba, Japan), Katsumasa Kamiya (Univ. of Tsukuba/Kanagawa Inst. of Tech., Japan), Kenji Shiraishi (Univ. of Tsukuba/Nagoya Univ., Japan)
Pagepp. 133 - 134

S7-4 (Time: 14:40 - 15:00)
TitleVth Shifts and Their Variability Behaviors of PFETs by ON-State and OFF-State Stress
Author*Nurul Ezaila Alias, Anil Kumar, Takuya Saraya, Toshiro Hiramoto (Univ. of Tokyo, Japan)
Pagepp. 135 - 136