| Title | Determination of the Defect Density in Thin Film Amorphous and Microcrystalline Silicon from ESR Measurements: The Influence of the Sample Preparation Procedure |
| Author | *Lihong Xiao (Forschungszentrum Jülich GmbH/Technische Univ. München, Germany), Oleksandr Astakhov, Friedhelm Finger (Forschungszentrum Jülich GmbH, Germany), Martin Stutzmann (Technische Univ. München, Germany) |
| Page | p. 230 |
| Title | The Amorphous and Crystalline Densities in Tetrahedrally Bonded Semiconductors |
| Author | *Mihai Popescu, Alin Velea (National Institute of Materials Physics, Romania) |
| Page | p. 231 |
| Title | Nanostructure and Interfaces In Hydrogenated Nanocrystalline Silicon |
| Author | *Kristin G. Kiriluk, Don L. Williamson, Jeremy Fields, P. Craig Taylor (Colorado School of Mines, U.S.A.), Baojie Yan (United Solar Ovonic, LLC, U.S.A.), David C. Bobela (National Renewable Energy Laboratory, U.S.A.) |
| Page | p. 232 |
| Title | Microcrystalline Silicon Thin Films studied by Photoconductive Atomic Force Microscopy |
| Author | *Martin Ledinsky, Aliaksei Vetushka, Jiri Stuchlik, Bohuslav Rezek, Antonin Fejfar, Jan Kocka (Institute of Physics, Academy of Sciences of the Czech Republic, Czech Republic) |
| Page | p. 233 |