Title | Intermediate-Range Atomic Structures in Amorphous Ge2Sb2Te5 Phase Change Material |
Author | *Shinya Hosokawa (Hiroshima Inst. of Tech., Japan), Wolf-Christian Pilgrim, Astrid Hohle, Daniel Szubrin (Univ. of Marburg, Germany), Nathalie Boudet, Jean-Francois Berar (CNRS, France), Kenji Maruyama (Niigata Univ., Japan), Gunnar Bruns, Matthias Wuttig (Rheinisch-Westfälische Technische Hochschule Aachen, Germany) |
Page | p. 79 |
Title | GexSnyTe1-x-y Phase Change Alloys for Applications in Electronic Data Storage |
Author | *Jennifer Luckas (RWTH Aachen Univ./ Laboratoire de Génie Electrique de Paris, Germany), Christophe Longeaud (Laboratoire de Génie Electrique de Paris, France), Matthias Wuttig (RWTH Aachen Univ., Germany) |
Page | p. 80 |
Title | Influence of Doping on the Properties of Phase-Change Memory Materials on the Basis of Ge-Sb-Te System |
Author | *Sergey Kozyukhin (Russian Academy of Sciences, Russian Federation), Alexey Sherchenkov, Peter Lazarenko (Moscow State Institute of Electronic Technology (Technical Univ.), Russian Federation), Phuc Nguyen (Russian Academy of Sciences, Russian Federation), Alexey Babich (Moscow State Institute of Electronic Technology (Technical Univ.), Russian Federation) |
Page | p. 81 |
Title | Electrical Transport Properties of Thin Films of Ge1Sb2Te4 and Ge2Sb2Te5 Phase-Change Materials |
Author | *Ling Xu, Lei Geng, Liang Tong, Dong Liu, Fei Yang, Jun Xu, Zhongyuan Ma, Weining Su, Kunji Chen (Nanjing Univ., China) |
Page | p. 82 |