| Title | [Keynote] Reliability Assessment of Electronic Packaging with Hybrid Approach of Experimental and Computational Mechanics | 
| Author | *Soon-Bok Lee, Ilho Kim (KAIST) | 
| Title | The evaluation and optimization of tape casting process for multi layered chip inductor | 
| Author | *Giho Jeong, Changsik Park (Samsung Electro-Mechanics) | 
| Title | Drift-Diffusion Device Simulation of Stress-Induced Effect on Electronic Characteristics of nMOSFETs | 
| Author | *Masaaki Koganemaru (Fukuoka Industrial Technology Center), Toru Ikeda, Noriyuki Miyazaki (Kyoto Univ.), Hajime Tomokage (Fukuoka Univ.) | 
| Title | Thermal stress analysis and geometric optimization of a heater module | 
| Author | Kengo Fujiki, *Keiji Ogi, Nagatoshi Okabe (Ehime Univ.) |