Title | [Keynote] Reliability Assessment of Electronic Packaging with Hybrid Approach of Experimental and Computational Mechanics |
Author | *Soon-Bok Lee, Ilho Kim (KAIST) |
Title | The evaluation and optimization of tape casting process for multi layered chip inductor |
Author | *Giho Jeong, Changsik Park (Samsung Electro-Mechanics) |
Title | Drift-Diffusion Device Simulation of Stress-Induced Effect on Electronic Characteristics of nMOSFETs |
Author | *Masaaki Koganemaru (Fukuoka Industrial Technology Center), Toru Ikeda, Noriyuki Miyazaki (Kyoto Univ.), Hajime Tomokage (Fukuoka Univ.) |
Title | Thermal stress analysis and geometric optimization of a heater module |
Author | Kengo Fujiki, *Keiji Ogi, Nagatoshi Okabe (Ehime Univ.) |