| Title | (Invited Paper) Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits |
| Author | *Ulf Schlichtmann (TU Munich, Germany), Masanori Hashimoto (Osaka University, Japan), Iris Hui-Ru Jiang (National Chiao Tung University, Taiwan), Bing Li (TU Munich, Germany) |
| Page | pp. 705 - 711 |
| Keyword | Aging Analysis, Timing Adaptation, Criticality-dependency-aware Timing |
| Abstract | At nanometer manufacturing technology nodes, process variations affect circuit performance significantly. In addition, performance deterioration of circuits due to aging effects is also increasing. Consequently, a large timing margin is required to maintain yield. To combat the pessimism and the resulting overdesign, aging analysis with high-level models, on-chip timing margin monitoring and tuning, and flexible delay models of flip-flops can be deployed. This paper gives an overview of the state of the art of applying these techniques to improve the health of circuits. |